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Product No: SMT-TB11
The Jointed Test Finger & Unjointed Test Fingers are precision test probes made according to Figure 2 (Test Probe B) and Figure 7 (Test Probe 11) of the IEC61032. They are used to simulate a human finger used by the standards of IEC, CSA, IRAM, UL etc.
1) IEC Jointed Test Finger 2 ( Test Probe B of IEC61032): LISUN model is SMT-IP20T
Test Probe Diameter: 12 mm
Test Probe Length: 80 mm
Baffle Plate Thickness: 20 mm
Baffle Plate Diameter: 50 mm
Baffle Plate Length: 100 mm
2) IEC Unjointed Test Finger 7 ( Test Probe 11 of IEC61032): LISUN model is SMT-1175
Test Probe Diameter: 12 mm
Test Probe Length: 80 mm
Baffle Plate Thickness: 5 mm
Baffle Plate Diameter: 50 mm
Standard:
IEC 61032 “Protection of persons and equipment by enclosures – Probes for verification”
IEC Jointed Test Finger 2 ( Test Probe B of IEC61032)
IEC Unjointed Test Finger 7 ( Test Probe 11 of IEC61032)
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