30N Force 12.5mm Test Sphere Probe IEC 61032

(1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt’ with may participate in this preparatory work.
International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization(ISO) in accordance with conditions determined ‘by agreement between” the two organizations.

SMT B125T_AL

(2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees.
(3)The documents produced have the form of recommendations for international use and are published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense.
(4) In order to promote international unification,IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible
in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter.
(5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards.
(6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 61032 has been prepared by IEC technical committee 70: Degrees of protection by enclosures.

4 Classification of test probes

Test probes are classified as follows:
a) according to their designation
– IP code probes;
– other probes;
b) according to the kind of protection they are intended to check
– access probes;
– object probes;
c) according to the specific hazard they are intended to check
– probes mainly intended to be used to verify the protection of persons against access to hazardous live parts or hazardous mechanical parts;
– probes specifically intended to be used to verify the protection of persons against access to hazardous mechanical parts;
– probes mainly intended to be used to verify the protection of persons against access to internal parts involving thermal hazard, for instance internal hot or glowing parts;
– probes intended to be used to verify the protection of equipment against ingress of solid foreign objects.

6 Test probes

6.1 IP code probes
6.1.1 IP code probes are intended to verify
– the protection of persons against access to hazardous parts;
– the protection of the equipment against the ingress of solid foreign objects.12.5mm Test Sphere Probe with 30N Force
This sphere is intended to verify the degree of protection of enclosures against ingress of solid foreign objects having a diameter of 12.5mm or greater.

30N Force 12.5mm Test Sphere Probe IEC 61032

Conforms to IEC61032 Figure 6 – Test Probe 2.
Sphere is Bearing Steel.
Thrust: 30N