IEC 61032 figure 1 Test Probe A: IP1X Test Probe with 50N Thrust

This 50mm Sphere IP1X Test Probe (also known as IP1X Probe A / Test Probe A) is an essential tool for electric shock protection testing of household and similar electrical appliances.
Fully compliant with IEC61032 figure 1 (the Test probe A) standards, it features an integrated baffle and ergonomic handle for stable, safe operation. Designed to simulate large foreign object access, the 50mm spherical probe verifies that hazardous internal components are inaccessible—ensuring appliances meet IP1X enclosure protection requirements and global safety regulations.

Specifications:
• Ball Diameter: 50mm
• Baffle Plate Diameter: 45mm
• Baffle Plate Thickness: 4mm
• Handle Diameter: 10mm
• Handle Length: 100mm
• According to IEC61032 figure 1 (the Test probe A), table 6 GB/T4208-2008 the first characteristics (1)
• Thrust: 10N/20N/30N/40N/50N

Test Procedures:
• Inspect the probe’s integrity, calibrate the thrust (10N–50N), and prepare the power-off, clean test appliance.
• Align the probe’s 50mm spherical tip with the appliance’s openings, ensuring the baffle is perpendicular to the probe axis.
• Apply the preset thrust steadily and test all critical access points from multiple angles.
• Check if the probe touches hazardous components, determine compliance, and record results.
• Clean the probe after testing and store it in a dry environment.

Applications:
• IP1X enclosure protection testing for household electrical appliances.
• Electric shock prevention compliance verification for similar electrical devices.
• Simulation of large foreign object access to hazardous internal components.
• Safety standard validation aligned with IEC61032 Figure 1 and global regulations.
• Pre-market or quality control testing for appliance safety compliance.

IEC61032 figure 1 IP1X Test Probe with 50N Thrust