
LM-79 Moving Detector Goniophotometer (Mirror Type C)
LSG-6000

High Precision Rotation Luminaire Goniophotometer
LSG-1890B

High Precision Rotation Luminaire Goniospectroradiometer
LSG-1890BCCD

Goniophotometer for Automotive and Signal Lamps
LSG-1950

Goniophotometer for Traffic Signal Lamps
LSG-1950S

Compact Goniophotometer
LSG-1200A

Near Field Moving Detector Goniophotometer
LSG-1900B





















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In the production process of electronic devices, there is always a crucial step, and using a high and low temperature chamber to test product quality has become that crucial step. So, why do electronic products need to be tested?
With the development of technology, electronic products gradually develop integration and structural refinement, with more processes and increasingly complex manufacturing processes. There are also potential defects in the manufacturing process. During the production and manufacturing process, product quality problems caused by unreasonable design, raw materials or process measures can be classified into two categories:
1. The produced product does not meet the usage requirements and the performance parameters do not meet the standards.
2. Potential defects that cannot be detected by ordinary detection methods need to be gradually exposed during use, such as unstable microstructure, surface contamination of silicon wafers, welding voids, poor matching of chip and shell thermal resistance, etc.
In general, this defect requires approximately 1000 hours of operation at the rated power and normal operating temperature of the component before it can be fully started. Obviously, it is impractical to test each component for a thousand hours, so it is necessary to apply heating stress and bias pressure to it, such as conducting high-temperature power stress tests on high and low temperature chambers to accelerate the early exposure of the defect.

By applying numerous comprehensive external forces to electronic products and simulating a harsh working environment with high and low temperature chambers, latent faults can occur as soon as possible, enabling the product to pass the initial stage of failure in the bathtub and achieve a highly reliable stability period.
Through high and low temperature chamber testing, the product can be exposed to safety hazards in advance during normal use, measure electrical parameters, screen faulty or changing components, and eliminate potential hazards in the early stages of normal use as much as possible, ensuring that the product can withstand the test of time when leaving the factory.
Safety issues to pay attention to when using high and low temperature chambers:
1. The switch power supply of the high and low temperature chamber is made of three-phase five wire, and the weapon equipment cable is a four copper core cable, with three live wire zero wires and one zero wire. Please consider zero line identification. Due to the fact that the unit load and control management system of weapons and equipment are single-phase, overlapping zero lines may cause the weapons and equipment to not rest and be damaged.
The handover ground wire of this weapon and equipment is a regular handover ground wire pole. Ensure the excellent delivery of weapons and equipment to ensure their safety. The overlapping of zero and ground wires may cause abnormal rest of weapons and equipment. Due to the need to expand the cable network for customers studying in the garden or other areas, please ensure that the main parameters of the commonly used extension cables and switch power supply ratings meet the requirements of the material switch power supply.
2. The high and low temperature chamber will eliminate a lot of heat during the use of this weapon equipment. Please keep the weapons and equipment in a well ventilated residence. Do not use this weapon or equipment near flammable materials or in flammable and explosive conditions. Do not use in magnetic fields and obvious vibration conditions.
3. Do not put the sample switch power supply into the weapon equipment switch power supply in the high and low temperature chamber, otherwise it will increase the load on the weapon equipment switch power supply. Unless it is a weapon or equipment leaving a sample switch power intersection.
4. High and low temperature chambers are prohibited from testing items that are flammable, explosive, highly corrosive, or highly radioactive. Do not transport or repair weapons and equipment when plugged in or during operation.
Temperature Humidity Chamber | Thermal Chamber | Climate Chamber is according to IEC60068-2-1 (GB/T2423.1) and IEC60068-2-2 (GB/T2423.2), IEC60068-2-78, IEC60598-1, GB/T2423.17, GB/T5170.2, GB/T5170.5. The climate chamber is used to test the CFL/LED which meets IES LM-80-08, electricity products, automative cars, home appications and mobiles.
Lisun Instruments Limited was found by LISUN GROUP in 2003. LISUN quality system has been strictly certified by ISO9001:2015. As a CIE Membership, LISUN products are designed based on CIE, IEC and other international or national standards. All products passed CE certificate and authenticated by the third party lab.
Our main products are Goniophotometer, Integrating Sphere, Spectroradiometer, Surge Generator, ESD Simulator Guns, EMI Receiver, EMC Test Equipment, Electrical Safety Tester, Environmental Chamber, Temperature Chamber, Climate Chamber, Thermal Chamber, Salt Spray Test, Dust Test Chamber, Waterproof Test, RoHS Test (EDXRF), Glow Wire Test and Needle Flame Test.
Please feel free to contact us if you need any support.
Tech Dep: Service@Lisungroup.com, Cell/WhatsApp:+8615317907381
Sales Dep: Sales@Lisungroup.com, Cell/WhatsApp:+8618117273997
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